|
型號:SN74BCT8240ADWRE4
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8245ANT
|
制造商:
|
描述:IC SCAN TEST DEVICE TXRX 24-DIP
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT760NSR
|
制造商:
|
描述:IC BUFFER NON-INVERT 5.5V 20SO
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8373ANT
|
制造商:
|
描述:IC SCAN TEST DEVICE LATCH 24-DIP
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8373ADWRG4
|
制造商:
|
描述:IC SCAN TEST DEVICE 24SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8245ANTG4
|
制造商:
|
描述:IC SCAN TEST DEVICE TXRX 24-DIP
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8240ANT
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-DIP
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8373ADWR
|
制造商:
|
描述:IC SCAN TEST DEVICE LATCH 24SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8240ADWR
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8244ADWE4
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8240ADW
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8244ADW
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8244ADWR
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8245ADWR
|
制造商:
|
描述:IC SCAN TEST DEVICE TXRX 24-SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8373ADW
|
制造商:
|
描述:IC SCAN TEST DEVICE LATCH 24SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8240ANTG4
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-DIP
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8373ADWRE4
|
制造商:
|
描述:IC SCAN TEST DEVICE LATCH 24SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8240ADWRG4
|
制造商:
|
描述:IC SCAN TEST DEVICE 24SOIC
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8244ANTG4
|
制造商:
|
描述:IC SCAN TEST DEVICE BUFF 24-DIP
|
RoHs狀態(tài):RoHS
|
|
型號:SN74BCT8245ADW
|
制造商:
|
描述:IC SCAN TEST DEVICE TXRX 24-SOIC
|
RoHs狀態(tài):RoHS
|